CVE-2024-53017

MEDIUM
Published Jun 3, 2025 Modified Aug 20, 2025 CWE-823

Description

Memory corruption while handling test pattern generator IOCTL command.

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CVSS v3.1 Score

6.6
MEDIUM
CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:L/I:H/A:L

Weakness Type (CWE)

CWE-823 CWE-823

Affected Products

Vendor Product
qualcomm sdm429w_firmware
qualcomm sdm429w
qualcomm snapdragon_429_mobile_platform_firmware
qualcomm snapdragon_429_mobile_platform
qualcomm wcn3620_firmware
qualcomm wcn3620
qualcomm wcn3660b_firmware
qualcomm wcn3660b

References

Frequently Asked Questions

What is CVE-2024-53017? +
Memory corruption while handling test pattern generator IOCTL command. It has a CVSS v3.1 base score of 6.6 (MEDIUM).
How severe is CVE-2024-53017? +
CVE-2024-53017 has a CVSS v3.1 score of 6.6 out of 10, rated MEDIUM. This is a medium-severity vulnerability that should be remediated as part of regular maintenance.
What products are affected by CVE-2024-53017? +
CVE-2024-53017 affects products from qualcomm, specifically: sdm429w, sdm429w_firmware, snapdragon_429_mobile_platform, snapdragon_429_mobile_platform_firmware, wcn3620, wcn3620_firmware, wcn3660b, wcn3660b_firmware. Check the affected products table above for specific version ranges.
How do I check if I'm vulnerable to CVE-2024-53017? +
You can use Secably's free Website Scanner to check your website for known vulnerabilities. For infrastructure scanning, use the Port Scanner to identify exposed services that may be affected. Check the vendor advisories linked above for specific patch and version information.

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